Logo SEMAPP                                   

Surface Characterization

1 & 2 February, 2016
Technical University of Denmark
Møderum 1
Anker Engelundsvej 1
2800 Lyngby

The conference aims to give a thorough insight into the vast number of surface investigation possibilities.

The conference consists of nine sessions with talks on practical cases and theoretical knowledge on surface investigation. How do the methods work? Which types of surfaces can be analyzed? What are the advantages, downsides and pitfalls?

In addition to the talks, the program is packed with networking opportunities.

In the exhitibion area, participants will be given the opportunity to meet the suppliers of analytical instruments and have their own piece of material analyzed.

List of participants

Program 1 February, 2016

8:30 - 9:00
Registration and breakfast
9:00 - 9:05
Welcome and introduction
9:05 - 9:35
Per Møller
How to ask the right questions to surface suppliers
Per Møller, Professor, DTU Mechanical Engineering, Technical University of Denmark

Asking for the right properties of a surface is often very complicated. Enquiering about simple properties such as thickness measurement and how and where to measure can be a challenge. When it comes to evaluation of corrosion properties and durability against wear, it gets more complicated. You can select a test. But will a test give you any information about the lifetime, and how to evaluate if a coating, over time, can release impurities to a product, e.g. in food or medicine? In this talk several problems will be discussed.

Per Møller is Professor of corrosion and surface technologies at the Dept. of Mechanical Engineering, DTU. He is editor/co-editor of more than 120 scientific papers and holds more than 20 patents in surface technologies.
  Session 1: Measurements of layer thickness
Chaired by Susanne Köhler, Chemical Manager, Elplatek
Per Møller
Introduction to layer thickness
Per Møller, Professor, DTU Mechanical Engineering, Technical University of Denmark

This talk will discuss the principles and common types of thickness measurements in addition to coating and substrate combination and precision.

Per Møller is Professor of corrosion and surface technologies at the Dept. of Mechanical Engineering, DTU. He is editor/co-editor of more than 120 scientific papers and holds more than 20 patents in surface technologies.
Per Møller
Electrochemical and "magnetic"measurements
Dr. André Kaufmann, Helmut Fischer AG

With a Couloscope (CMS), a coulometric instrument from Fischer, you have a tool at your side with which you can measure coating thicknesses of metallic layers but also the electro-chemical potential. Hence, a coulometric system is an instrument for sensing the electro-chemical properties of a substance i.e. a more or less easily oxidisable and eletrons conductiong material like a metal. With this, one can likely predict the corrosion resistance (relative to each other) of a layer respectively of a layered system. The second part of this talk will discuss thickness measurements using the magnetic-induction method. As alternative methods eddy-current (amplitude and phase-sensitive) and beta backscattering methods are also explained. The same methods are applied to applications other than film thickness measurements, namely measuremens of the ferrite content in steels, the electrical conductivity in non-ferrous metals. Hand-probes using above mentioned methods are very convenient in terms of costs and applicability, and of course because of the scope of material systems and scales they can cover.

André Kaufmann holds a PhD in AFM studies of nanostructues and their fracture behaviour from the Paul Scherrer Institut, Switzerland. He has been employed as a scientist at Helmut Fischer since 2012.
10:25 - 10:55
Visit to exhibition and networking opportunity

Session 1: Measurements of layer thickness (continued)
Chaired by Susanne Köhler, Chemical Manager, Elplatek
10:55 - 11.30 Rob Verstegen

Measurement of layer thickness using x-ray fluorescence, eddy current and micro-resistance
Rob Verstegen, Owner of Verlab Analytical, distributor of Oxford Instruments

The x-ray fluorescence is a fast and accurate method to analyze the thickness and composition of a single or multi layer coating on any substrate. Micro spot analysis and SSD detector answer the continuous demand of thinner coatings on smaller items.
For the galvanic industry, the eddy current (phase shift) method is a powerful tool to measure accurate and fast single metal coatings on ferro substrates. Also, eddy current can be sued for printed circuit boards to measure through -hole copper inside a hole or surface copper on single and multilayer boards using micro resistance.

Session 2: Computed tomography
Chaired by Rune Juul Christiansen, PhD student, DTU Mechanical Engineering, Technical University of Denmark
11:30 - 11:50
Peter Leisner

Imaging at DTU: examples of micro CT x-ray tomography of non-conventional samples
Carsten Gundlach, Senior Research Engineer, DTU Physics

X-ray micro tomography is a technique for studying structural information both in the bulk and at the surface layers of different materials. The Imaging Industry Portal uses the X-ray tomography systems within the Imaging Center and with the use of large scale facilities to collaborate with companies for material development and quality control. The presentation will contain some study cases.
11:50 - 12:10
Peter Leisner

Examination of coatings and interfaces by CT X-ray
Peter Leisner, Head of Electronics Dept., SP Technical Research Institute of Sweden, and Professor in Surface Technology, Jönköping University, Sweden

The presentation will give examples on examination of inhomogeneous coatings and interface between coating and substrate. Combined with other analytical techniques, CT X-ray reveals valuable information of the coating. This will include examination of anodizing of difficult-to-cast aluminium alloys, and plated dispersion coating.

Peter Leisner is M.Sc. in Chem. Eng. and PhD in surface technology, and has more than 25 years of experience in applied research in surface technology.
12:10 - 12:30
Stig Larsen

CT X-ray as a tool for industrial quality control
Stig Larsen, Specialist in physical failure analysis, SP Technical Research Institute of Sweden A/S, Copenhagen

This presentation will give an introduction to CT X-ray from an industrial point of view. Pros and cons wil be discussed and compared with 2D X-ray among other methods and illustrated by different examples. The use of different types of imaging techniques to reveal information from obtained pictures will be illustrated, and exemplified by quality control of solder interconnects within electronics.

Stig Larsen is M.Sc. in Mech. Eng. and has more than 20 years of experience in industrial quality control and physical failure analysis.
Session 3: Color measurement and reflection measurements, translucency
Chaired by Per Møller, Professor, DTU Mechanical Engineering, Technical University of Denmark
13:45 - 14:15
Mads Strenov

Basic understanding of colour measurement and evalution of weathering
Mads Strenov, Manager & Product Specialist, Strenometer

This talk gives a brief introduction to how to measure colour with indicators, laboratory instruments and in-line measurements. The talk will also touch upon the tolerances of colour and the influence of weathering on both colours and surfaces.

Mads Strenov has worked with equipment to qualifty surfaces and coatings for more than 30 years. He is an expert in all aspects of colour, thickness meassurments of materials and coatings.

Session 4: Surface topography
Chaired by Peter Gundel, Bodycote Varmebehandling A/S
14:15 - 14:45
Hans Norgaard Hansen

Characterization of nano-scale surface texture using Atomic Force Microscopy
Hans Nørgaard Hansen, Deputy Head of Department and Professor, DTU Mechanical Engineering, Technical University of Denmark

Characterization of ultra-fine surfaces using atomic force microscopy (AFM) is a challenging task. Measuring capabilities in terms of range and resolution set high demands to the surfaces under investigation.
This presentation shows possible applications of AFM for surface texture characterization and the use of the results in process control. Instrument calibration and uncertainty estimation is discussed as an important tool in qualifying the measurement results.

Professor Hans Nørgaard Hansen is working in the field of Micro/Nano Manufacturing. He deals with establishing the basis of industrial production of products and components in metal, polymers and ceramics in the micro- and nanometer regime. Specific activities include product development, materials development and development of processes and production systems focused on micro mechanical systems.
14:45 - 15:15
Rob van Beek

Roughness, topography and form measurement by focus variation microscopy
Rob van Beek, Sales Engineer, ST Instruments

ST Instruments offer a comprehensive array of surface and materials characterization techniques, delivering innovative solutions for micro and nanotechnology and life science. With our broad range of techniques, a highly qualified and experienced scientific staff, ST Instruments are particularly suited to help solve your most challenging materials problems.
For optical profiling and surface roughness measurements, ST Instruments represent the measurement solutions of Alicona Imaging. The 3D Optical Profilers of Alicona are based on focus-variation microsocpy which are used to measure form and roughness. Even at surfaces with steep flanks and varying reflection properties, users achieve traceable results in high resolutions and repeatability.

Rob van Beek is Product Manager of 3D Optical Profiling and Nano/Micro Mechanical Surface Characterization at ST Instruments.
15:15 - 15:45

Visit to exhibition and networking opportunity

Session 5: Measurements of mechanical properties
Chaired by Bjarke Holl Christensen, Senior Specialist, Tribologicenteret, Danish Technological Institute, Aarhus
15:45 - 16:15
Per Møller
Conventional measurements of hardness
Dr. André Kaufmann, Helmut Fischer AG

Hardness i.e. the resistivity of a material against the impact of another, harder material is something mankind has observed quite early while exploring his environment. During the period of industrialization, this topic has become very important e.g. because of the production of large-scale mechanical systems. However, this method was always limited to the bulk properties of a material. The mechanical properties of the volume are of course very important but mechanical effects like abrasion but also (mechanical-)chemical effects like corrosion are strongly surface dependant. With a so-called nano-indenter it is now possible to get mechanical information about the top most surface layer in order to answer questions like the ones mentioned above. In this talk, the system, principles and applications get explained.

André Kaufmann holds a PhD in AFM studies of nanostructues and their fracture behaviour from the Paul Scherrer Institut, Switzerland. He has been employed as a scientist at Helmut Fischer since 2012
16:15 - 17:15
Rob van Beek

Mechanical characterization of materials surfaces at the micro and nano scale
Rob van Beek, Sales Engineer, ST Instruments

Mechanical properties like hardness, elastic modulus, scratch resistance and wear resistance are essential for the final use in many different industrial applicaitons. In order to evaluate the characteristics fo these materials in real life conditions, their mechanical properties must be well determined.
The interest of mechanical characterization at small scales is to be able to evaluate the mechanical prooperties of surfaces at the samlledst penetration depth or eventually of think films without the influence of the substrate.
Different complementary methods of testing are reviewed: nanoindentation testing for hardness and elastic modulus determination, scratch testing for adhesion evaluation of think films or scratch resistance, microtribology testing for friction coefficient determination.

Rob van Beek is Product Manager of 3D Optical Profiling and Nano/Micro Mechanical Surface Characterization at ST Instruments.
18:30 - 22:00

Conference dinner
Program 2 February, 2016

Session 6: Light Optical Microscopy
Chaired by Susanne Köhler, Chemical Manager, Elplatek
8:30 - 9:30
Jedrzej Schmeidel
Classical light microscopy techniques for surface characterization
Dr. Jedrzej Schmeidel, Application Specialist, Zeiss

Light microscopy applications nowadays depend largely on the use of computer systems. Still, the classical microscopy methods, some of which were developed and used more than 100 years, can in no way be neglected. This talk will focus on basic hardware microscope configuration, setup and the contrasting methods such as Bright Field, Dark Field, Polarization, Fluorescence and Confocal. Understanding and correctly using these methods, give a deeper insight into the samples which results in an easier and more precise evaluation. Furthermore, it is important to note the significance of classical contrasting methods as they cannot be substituted with any image post-processing function.

Dr. Jedrzej Schmeidel holds a PhD in Physics, Atmoci and Molecular structures division from Leibniz University of Hannover, Germany. At Carl Zeiss Microscopy GmbH he is Application Specialist.
9:30 – 10:00 Steen Ørsted

Micro topography analysis of elongated structures
Steen Ørsted, Founder and co-owner of DeltaPix

So far it has been difficult to combine multiple measurements of depth/width on surface structures which elongates thousands of time more than the required precision of each measurement. DeltaPix will present its solution to optical 3D topographic surface analysis with micro precision, combined with methods for automatic measurement of depth/width of elongated surface structures.

Steen Ørsted i M.Sc.E.E. from Aalborg University and founder and co-owner of DeltaPix since 2011.
10:00 - 10:30
Visit to exhibition and networking opportunity
Session 7: Scanning Electron Microscopy
Chaired by Anette Alsted Rasmussen, Head of development, IPU
10:30 – 11:30 Peter Gnauck

Imaging and analysis with electrons, X-rays and ions
Peter Gnauck, Senior Manager of Business Development, Zeiss

In the last decades, electron microscopy has become standard a standard evaluation technique in the field of semiconductor technology, materials science as well as life science. The capability of modern electron microscopes to extend the resolution limit to subnanometer resolution makes them a very powerful tool to investigate the nanostructure on various samples. By adding a focused ion beam system to the electron microscope, it is possible to remove material and to open up the third dimension for sample analysis. The presentation will cover the technology background and operating principle of modern electron microscopes as well as state of the art applications for scanning electron microscopy and focused ion bean systems.

Peter Gnauck is Senior Manager of Business Development at Carl Zeiss since 2006. He holds a PhD in physics from the University of Tuebingen, Germany.
11:30 – 12:00 Erik Wisaeus

Cryo-SEM – nanoscale imaging of non-solid samples with preserved integrity
Erik Wisaeus, Consultant, Nano- and Microtechnology, Danish Technological Institute

Did you ever put a piece of cheese in an electron microscope? Not all samples are comfortable within the vacuum of a SEM, but by preparing and imaging the sample in cryogenic conditions, the range of materials you can study is greatly expanded.
At DTI, we use cryogenic scanning electron microscopy to aid the industry with characterization of sensitive materials such as suspensions, emulsions and humid or oily material.
The presentation will introduce you to the method and possibilities with Cryo-SEM, with main focus on practical cases.

Erik Wisaeus is a materials characterization specialist at DTI since 2010, working primarily with various types of electron microscopy. He holds a M.Sc. degree in Engineering Nanoscience from Lund University, Sweden.
12:00 - 13:15

Session 8: Surface analysis at nanometer level with profiling
Chaired by Daniel Minzari, Senior Consultant, IPU
13:15 – 13:50
Per Morgen

Surface and interface analyses with XPS, AES and SIMS
Per Morgen, Emeritus Professor, University of Southern Denmark

The application of these surface sensitive techniques will be demonstrated with examples from current R&D projects (Li-air batteries, development of new catalysts from second generation bioethanol production, plasmonic structures for SERS, and growth of new epitxaial semiconductor and optoelectronic component structures).

Per Morgen is Emeritus Professor at University of Southern Denmark. He obtained his doctorate degree dr. scient. from University of Southern Denmark in 1991, and has been employed at University of Copenhagen in addition to universities in Brazil, France and India.
13:50 – 14:10
Rameez Ud Din

Chemical elemental profiling by glow discharge optical emission spectroscopy (GDOES)
Rameez Ud Din, Post doc, Dept. of Mechanical Engineering, Technical University of Denmark

Glow discharge optical emission spectrometry (GDOES) is a method for elemental analysis of solids. Both the bulk analysis of homogeneous samples and the depth profile analysis of coating–substrate systems and surface-modified materials are possible. Glow discharges exist in dc (direct current) and rf (radio frequency) varieties. Today, there is a rapidly growing interest in rf sources, mainly due to their capability of sputtering non-conducting materials. The purpose of this presentation is to present the brief implementation of this technique and to show the kind and quality of analytical information that can be obtained with this method, with emphasis on the accuracy in the analysis of multi-matrix systems.

Rameez Ud Din holds a PhD from DTU in surface modification and corrosion related issues on aluminium. He currently works on an industrial post doc project which is a collaboration between Hempel and DTU
14:10 - 14:40
Visit to exhibition and networking opportunity

Session 9: IR-technologies
Chaired by Daniel Minzari, Senior Consultant, IPU
14:40 – 15:10

Thomas Røll

Rapid characterization of multiple regions of interest in a sample using automated IR microscopy
Thomas Røll, Product Specialist/Account Manager, PerkinElmer Denmark

IR microscopy is a well-established analytical technique for the measurement and identification of small samples down to a few micrometers in size. It is used extensively in the polymer, pharmaceutical, chemical, food and electronics industries, to name a few, often identifying small contaminations or foreign objects of unknowns origin. In forensic applications small particles of materials such as drugs, paint chips, residues or fibers are often collected as evidence and analyzed by IR microscopy.
The type and size of the material, as well as the matrix in which the sample is contained, will dictate the type of IR microscopy sampling technique to be deployed; transmission, reflectance, or ATR.

Thomas Røll has 25 years of experience in sales and application support for spectroscopy techniques in Denmark.
15:10 – 15:40

Morten Køcks

Raman spectroscopy - non-desctructive chemical analysis and ID of contaminants
Morten Køcks, Consultant, Specialist, Danish Technological Institute

Raman micro-spectroscopy is a fast and versatile tool for non-destructive surface analysis and identification of e.g. foreign bodies and contaminants in products. No sample preparation is necessary and the method can also be used for surface mapping of chemistry and depth profiling of e.g. polymer layers. A Raman spectrum is a chemical fingerprint of the molecules that make up the material of interest and identification typically occur by comparing the spectrum with database spectra or references. A strength of the technique is the ability to gain information on the sample chemistry from rather small areas (down to 1x1 µm). This can in some cases also be a drawback as it limits the surface area that can be investigated. Potential challenges can be fluorescence from the sample and weak Raman signals. In such cases, other techniques such as infrared (IR) spectroscopy, elemental analysis by x-ray fluorescence or other chemical analysis available at DTI can be offered.

Morten Køcks is a specialist in process and material chemistry. He holds a M.Sc. degree in physics from Aarhus University and his areas of interest include online measurement technologies and advanced spectroscopic methods for chemical characterization.
Registration fee
Members of ATV-SEMAPP or other promoting organizations: DKK 3,800
Others: DKK 4,500
Early bird discount of DKK 400 by registration before 16 January 2016.
Ph.D. students at ATV-SEMAPP member institutions: DKK 975
B.Sc. and M.Sc. student members: DKK 200 (student membership is free of charge)
Ph.D. students, B.Sc. and M.Sc. student members do not benefit from early registration.
All prices are excluded of Danish VAT.

The registration fee includes full participation, lunch, coffee and conference dinner as well as seminar material.

Sign up by using this registration form. A confirmation e-mail will be sent to you within a few minutes. Don't forget to check your spam filter if you don't receive it.

Cancellations received before 20 January 2016 are fully refunded. No refund for cancellations received 20 January or later neither for not showing up.
Substitutions are accepted at any time.

In case of any questions, please do not hesitate to contact ATV-SEMAPP by e-mailing semapp@atv-semapp.dk or phoning Jytte Laursen, +45 4525 4898, Anette Kaltoft, +45 4525 4717 (09:00-12:30) or Ulla Knudsen, +45 4525 4898.

Access to speakers presentations HERE (with Username and Password)

        Logo Teknovation

IDA Mechanical         IDA Polymer

IDA Materialeteknologi         IDA Materialeteknologi         IDA Materialeteknologi